Fine wire diameter measurement, laser diffraction sensor, surface quality check

Instruments

Fines wires

CERSA-MCI has developed a common technology and software environment for a line of optronic measurment instruments applied to wire and cables, called : Laser Sensor (LS) This line only uses static components, with no moving parts (mirror).

An experience started by 1987 in the wire industry, allows us to propose today a line of compact instruments and accessories, with extended performances especially made for production lines initially, single units or in network. They are also widely used today in laboratories due to their exceptional metrological performances.

Ξ Very fine wire diameter measurement

LDS: Laser Diffraction Sensor
$laser diffraction sensor$ Since 1989, these instruments offer the fine wire industries outstanding metrological performances. Wire vibration measurement independents,

all the specifications are indicated for each single measure. No averaging. This allows realistic in line measurements and statistics.

The standard reference wires come from different highly specialized laboratories, in different countries. The measures are correlated between them

and the theory insuring our customers a recognized international metrological reference.

Diameters from 5 to 2000µm (0.2 to 80 mils), 1 or 2 axes.

Repeatability within 0.03% of the diameter limited to ±0.01µm.

Temperature compensated from 10 to 40°C (50 to 104°F)

Capability to evaluate the surface quality, roughness.

"Local display and keyboard"

Some useful options are available for those instruments, like :

Wire Sample Rotation (WSR) at constant tension (fine wires in laboratories).
Oscillating Support (OS) for in line ovality measurement.
Portable instruments, battery powered.(measure recording and PC transfer)
Set of 4 reference wires for calibration and ISO certification: 30 to 2000 microns ±0.1µm

Applications to the metallic wires, fibres, capillary, filaments, bonding wires, enameled wires, drawing dies….

Ξ Fine wire surface quality check: SQM-F (international patent)

SQM-F: Surface Quality Measurement
With 64 dots per turn, 330 000 turns per second, the SQM-Fine is a true technology revolution that allows the detection of any fine surface defect, roughness, color and form change, in high speed production lines.

Ranges from 20µm to 2mm, (0.8 to 80mils)

Advanced information

Applications to the fine metallic wires, fibres, capillaries, filaments, bonding wires, enameled wires,….

Ξ Nos références

Fine wires : Tungsten, Bonding, Steel cord, stainless steel, copper, carbon fiber, die shops

Wires : steel cord, saw wires, stainless steel, copper, enameled wires.