Surface defects detection
T he SQM is a true innovative and patented instrument, long initiated at the customer demand, to continuously check in line the surface quality of fine wires. It works like a ring camera, all around the circumference of the wire.
L ike all other CERSA instruments, the SQM is a non-contact measurement system, wire vibration measurement independent. It completes our line of dimensional measurement instruments on production lines. European patent.
C urrently tested on customers applications, SQM used in combination with LPS gauge will generate a complete image of the surface of the wire to detect any defect, shapes disturbance, scratches, platting missing, even geometry defects like lump&neck. A real step forward in your quality process !
Range Ø from 20 to 2000µm (0,8 to 80mils)
SQM-F (coming 2019 !)
Application on metallic wires, coated wires, fibers, etc.
CIM PROD : PC software
CIM PROD Software
Connected to SQM, our software generate and compute the defect surface, depending on adjusting tolerances and threshold.