
Manufacturers need to check the final diameter of the coated optical fiber, but also to detect lump&neck flaws in the coating. With its 5 measuring axes that cover 100% of the surface, and its exceptional measuring speed, the CM5 is the perfect instrument for a complete inspection of the coated fiber.
CERSA has continued to upgrade its device over time by adding additional features such as the detection of internal flaws in the coating (bubbles, particles), but also the measurement of asymmetry in coating layers. The data are displayed on the screen of a PC equipped with our CIM Prod software or via that of a production PLC previously connected to our CM5.
Diameter and flaw detector for coated fiber optics
The CM5 is a powerful, complete system (final diameter measurement, asymmetry and detection of internal flaws such as lumping and neckdowns, able to adapt to the ever-increasing drawing speeds to gain in productivity.
The CM5 should be installed before the capstan, i.e. before the coated fiber touches a pulley, to avoid the detection of marks that could appear on the surface due to fiber-pulley contact. The extreme sensitivity of the CM5 could generate false flaws in this case.
100% inspection of the optical fiber
This CM5 measuring system exists in both Base and Full versions.The features of the Base CM5:
- Measurement of the external diameter of the coated optical fiber (245µm).
- Continuous detection of lump and neckdown flaws after the second coating.
- Accurate measurement of the fiber position (assists with the positioning and alignment of the drawing tower)
The additional features provided by the Full CM5:
- Detection of flaws within the coated layers to ensure a longer service-life for the optical fiber.
- Measurement of the asymmetry of the glass protection coating layers to ensure continuous control of the concentricity of the layers that make up the optical fiber.
Digital and analog inputs and outputs, RS232 output, fieldbus options, are used to connect the CM5 to the PLC tower for control loop needs and measurement analysis.