Offline

The WIRE360 - surface sample inspection

Ø 15 -2000µm
Illustrative image of the category Offline surface sample defect detection of wires, cables and tubes.
This is the main image of Cersa MCI's offline surface sample defect detection product, a measuring instrument for wires, cables and tubes.

Surface inspection - offline measurement : For what purpose?

The demand for faster production and smaller dimensions, zero defects and material savings, has led CERSA to develop new high-performance gauge. Our SQM-F gauge is designed to detect defects such as scratches, die marks, dents, blisters or particles that can appear on the surface of a wire/cable/tube during the manufacturing process.

CERSA has developed a bench to use our SQM-F offline. The goal is to fix samples (from 15µm to 2000µm) straight and centered in the measuring instrument. The linear displacement is manual and provides enough movement to characterize a surface sample around 500mm long. A PC software provides tools for displaying and analyzing the image of the product surface.

Applications :

- Qualitycontrol by checking wire sample surface appearance
- Indirect die control effect by analyzing the wire drawn
- Incoming inspection (quality control)

Types of wires :

- Metallic wires with reflective surfaces (steel, copper, gold, silver, iridium, titanium,etc.)
- Enameled wires, coated wires
- Medical tubes

Commercial documentation

Instruments making up this solution

This is the main image of Cersa WST product.

WST - SQMF : test bench

A tool specifically designed for the SQM-F to manipulate samples easily. CERSA developed a test bench to use our SQM-F offline. The goal is to fix samples (from 15µm to 2000µm) straight and centered in the measuring instrument. The linear displacement is manual and provides enough movement to characterize a surface sample of around 500mm long

Technical documentation
This is the main image of Cersa MCI's SQM-F product, an inline surface defect detector instrument for wires, cables and tubes.

SQMF

The SQMF offers high-resolution and real-time surface defect detection on fine wires, cables and tubes with 128 pixels per circumference and 200,000 images per second. The defect image is displayed on CIM soft for customer analysis and characterization. The minimum linear resolution is 18μm. 100% of the surface is covered. Its high-measurement rate help to characterize continuously fine defects in real-time and to display their images on your PC. A perfect partner for diameter measuring devices such as the LDS and DLN instruments from CERSA.

Technical documentation

Our software solution for Surface Sample measurement

WIRE360 software

Software developed by CERSA engineers to provide all the tools needed for taking advantage of the WIRE360 solution.

Our software offers comprehensive functions for displaying the sample surface image, for playing with parameters for detecting and displaying defects, and for recording the data to get the most out of the SQM-F off-line.
Provided as a package with the WIRE360 solution.

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