Offline

The WIRE360 - surface sample inspection

Ø 15 -2000µm
Illustrative image of the category Offline surface sample defect detection of wires, cables and tubes.
This is the main image of Cersa MCI's offline surface sample defect detection product, a measuring instrument for wires, cables and tubes.

Surface inspection - offline measurement : For what purpose?

The demand for faster production and smaller dimensions, zero defects and material savings, has led CERSA to develop new high-performance gauge. Our SQM-F gauge is designed to detect defects such as scratches, die marks, dents, blisters or particles that can appear on the surface of a wire/cable/tube during the manufacturing process.

CERSA has developed a bench to use our SQM-F offline. The goal is to fix samples (from 15µm to 2000µm) straight and centered in the measuring instrument. The linear displacement is manual and provides enough movement to characterize a surface sample around 500mm long. A PC software provides tools for displaying and analyzing the image of the product surface.

Applications :

- Qualitycontrol by checking wire sample surface appearance
- Indirect die control effect by analyzing the wire drawn
- Incoming inspection (quality control)

Types of wires :

- Metallic wires with reflective surfaces (steel, copper, gold, silver, iridium, titanium,etc.)
- Enameled wires, coated wires
- Medical tubes

Technical documentation

Instruments making up this solution

This is the main image of Cersa MCI's SQM-F product, a surface defect detector instrument for wires, cables and tubes.

SQM-F : surface defect detector

For detecting small defects on the surface right around the sample. The SQM has been developed specifically for wire surface characterization of small wires/tubes. It acts as a surface defect detector by generating an alarm each time a detected defect exceeds the limits set by the operator. An image over 360° is also generated all along the sample.

Technical documentation
This is the main image of Cersa WST product.

WST - SQMF : test bench

A tool specifically designed for the SQM-F to manipulate samples easily. CERSA developed a test bench to use our SQM-F offline. The goal is to fix samples (from 15µm to 2000µm) straight and centered in the measuring instrument. The linear displacement is manual and provides enough movement to characterize a surface sample of around 500mm long

Technical documentation

Our software solution for Surface Sample measurement

WIRE360 software

Software developed by CERSA engineers to provide all the tools needed for taking advantage of the WIRE360 solution.

Our software offers comprehensive functions for displaying the sample surface image, for playing with parameters for detecting and displaying defects, and for recording the data to get the most out of the SQM-F off-line.
Provided as a package with the WIRE360 solution.

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